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Inter-American Metrology System (SIM)


The Inter-american Metrology System (SIM) resulted from a broad agreement among national metrology organizations from all 34 member nations of the Organization of American States (OAS).


Created to promote international, particularly Inter-american, and regional cooperation in metrology, SIM is committed to the implementation of a Global Measurement System within the Americas, in which all users can have confidence.

Latest News

SIM Meeting Calendar 2008

SIM 2007 General Assembly: Ottawa / Canada, 24th and 25th September

SIM Quality System Working Group Meeting, San José, Costa Rica - November 15th, 2007

Next Events

SIM Electricity and Magnetism Metrology Working Group: Comparison Workshops and Annual Meeting, Gaithersbug/USA, February 25th to 29th

SIM Quality System Task Force Meeting - Santiago/Chile, March 3rd and 4th


OAS - The Organization of American States - logo